Associate Professor, Materials Science & Engineering
Experimental electron energy-loss spectroscopy (EELS), scanning transmission electron microscopy (STEM), theoretical calculations based on density functional theory (DFT)
Ph.D. Physics, University of California Davis, 2004
M.S. Physics, University of Illinois at Chicago, 2003
B.Sc Physics, Universidad de Los Andes, Colombia, 2000
Juan Carlos Idrobo joins Materials Science & Engineering from the Oak Ridge National Laboratory where he was a senior staff scientist, and a group leader at the Scanning Transmission Electron Microscopy Group at the Center for Nanophase Materials Sciences.
In his research, Idrobo works at the atomic and nanometer scale, applying analytical techniques in electron spectroscopy within monochromated and aberration-corrected scanning transmission electron microscopy to study the structure, electronic, magnetic, thermal, optical and topological properties of materials, in particular the influence of point and extended defects on macroscopic properties. Idrobo has published more than 170 papers in peer reviewed journals with more than 17,000 citations, and was recognized by Clarivate Analytics to be among the top 1% of researchers being cited in Cross-Field in Web of Science between 2006 and 2016.