Seventh International Conference on Non-contact Atomic Force Microscopy
12-15 September 2004
Seattle, USA
ncAFM 2004 Conference Activities
and Presentation Schedule
for Talks and Posters
| Sunday, September 12, 2004 |
Physics Astronomy Building, University of Washington
Campus
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Optional, extra ticket event: |
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| Optional (registration required): Pre-Conference Workshop: ncAFM for New Investigators, 13:00-17:00, Rm. A110 Physics/Astronomy Building |
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| Welcome Reception and Registration Check-In, 17:00-19:00 Physics Astronomy Building, University of Washington Campus |
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| Monday, September 13, 2004 |
Physics Astronomy Building, University of Washington
Campus
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| Abstract | Session Title | Presenter | time | Abstract Title | Country | Authors |
| Fain | M0900 | Opening Remarks | ||||
| 02Reichling5.pdf | Atomic Resolution | Reichling | M0920 | Investigating Atomic Details of the CaF2(111) Surface with a qPlus sensor | Germany | Giessibl, Reichling |
| 02Schwarz3.pdf | Atomic Resolution | Schwarz | M0940 | Contrast Formation on Surfaces Composed of Hexagonally Arranged Carbon Atoms | Germany | Ashino, Schwarz, Hoelscher, Schwarz, Allers, Wiesendanger |
| 07Giessibl3.pdf | Atomic Resolution | Giessibl | M1000 | Sub-Angstrom resolution by force microscopy | Germany | Hembacher, Giessibl, Mannhart |
| M1020 | Break | |||||
| 13Ashino1.pdf | Low T and Magnetism | Ashino | M1100 | Three-dimensional force field spectroscopy of a single-walled carbon nanotube | Germany | Ashino, Maltezopoulos, Behnke, Schwarz, Wiesendanger |
| 12Schmid11.pdf | Low T and Magnetism | Schmid | M1120 | High Resolution Imaging and Determination of the Uncompensated Spin Density in Exchange-Biased Antiferromagnetic/Ferromagnetic thin Films | Switzerland | Schmid, Kappenberger, Hug |
| 12Liebmann3.pdf | Low T and Magnetism | Liebmann | M1140 | Visualization of the Barkhausen Effect by Magnetic Force Microscopy | USA | Liebmann, Schwarz, Kaiser, Wiesendanger, Noh, Kim |
| M1200 |
Lunch Break |
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| 01Kawai6.pdf | Cantilever Dynamics | Kawai | M1400 | Vertical and Lateral Force Detection with a Megahertz Resonance Frequency Cantilever | Japan | Kawai, Kitamura, Kobayashi, Kawakatsu |
| 01Karrai14.pdf | Cantilever Dynamics | Karrai | M1440 | Optical Tunable Mechanics of Microlevers (Invited) | Germany | Hoehberger, Karrai |
| M1500 | Break | |||||
| 04Kantorovich4.pdf | Dissipation | Kantorovich | M1540 | General Theory of NC-AFM at a Close Approach: from Imaging to Dissipation | United Kingdom | Kantorovich, Trevethan |
| 07Ozer4.pdf | Dissipation | Ozer | M1600 | Dissipative Interactions between Tip and Sample Measured Using Ultra-small Oscillation Amplitudes | Ireland | Ozer, Norris, O'Brien, Pethica |
| 06Schirmeisen4.pdf | Dissipation | Schirmeisen | M1620 | Velocity Dependence of the Energy Dissipation in Dynamic Force Microscopy | Germany | Schirmeisen, Weiner, Hoelscher, Fuchs |
| 06Szoszkiewicz7.pdf | Dissipation | Szoszkiewicz | M1640 | Local Scale Correlations between Adhesion Hysteresis and Friction | USA | Szoszkiewicz, Bhushan, Huey, Kulik, Gremaud, Riedo |
| M1930- 2130 |
Poster Session (Monday Posters listed below) | |||||
| Tuesday, September 14, 2004 |
Physics Astronomy Building, University of Washington
Campus
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| 15Custance4.pdf | Atomic Manipulation | Custance | T0900 | Using Noncontact Atomic Force Microscopy for Laterally Manipulating Single Atoms at Semiconductor Surfaces (Invited) | Japan | Oyabu, Sugimoto, Custance, Abe, Morita |
| 15Oyabu2.pdf | Atomic Manipulation | Oyabu | T0940 | Mechanical Vertical Manipulation of Single Atoms on the Ge(111)-c(2x8) Surface by Noncontact Atomic Force Microscopy | Japan | Oyabu, Custance, Abe, Morita |
| 04Stich1.pdf | Atomic Manipulation | Stich | T1000 | Toward Chemical Resolution and Atomic Manipulation with Dynamic AFM | Slovak Republic | Stich, Dieska, Perez |
| T1020 | Break | |||||
| 11Zimmerli10.pdf | Imaging Molecules in Vacuum | Zimmerli | T1100 | Trapping and self-assembly of polar molecules in nanometer-sized pits on an insulator | Switzerland | Zimmerli, Nony, Gnecco, Baratoff, Alkauskas, Bennewitz, Pfeiffer, Maier, Wetzel, Meyer, Gerber |
| 11Burke12.pdf | Imaging Molecules in Vacuum | Burke | T1120 | High resolution imaging of C60 on KBr: a prototypical molecule-insulator system | Canada | Burke, Mativetsky, Hoffmann, Grutter |
| 11Foster5.pdf | Imaging Molecules in Vacuum | Foster | T1140 | Simulating imaging of organic adsorbates on oxide surfaces | Finland | Foster, Gal, Shluger, Nieminen |
| T1200 | Lunch Break | |||||
| 11Loppacher1.pdf | Surface Potentials | Loppacher | T1400 | Quantitative Surface Potential Tracking of Organic Adsorbates (Invited) | Germany | Loppacher, Zerweck, Otto, Teich, Beyreuther, Grafstroem, Eng |
| 12Onishi6.pdf | Surface Potentials | Onishi | T1440 | Platinum Adatoms on TiO2(110) Observed by Kelvin Probe Microscope | Japan | Sasahara, Pang, Uetsuka, Onishi |
| T1500 | Break | |||||
| 11Matsumoto16.pdf | Molecules, Clusters, and Storage | Matsumoto | T1540 | Surface Potential Images of Molecular Systems on Insulating Substrates by Frequency-mode Scanning Force Microscopy | Japan | Matsumoto, Yamada, Takagi, Kawai |
| 10Tait15.pdf | Molecules, Clusters, and Storage | Tait | T1600 | Non-contact Atomic Force Microscopy of Model Catalysts: Pd / a-Al2O3(0001) | USA | Tait, Ngo, Yu, Jarvis, Uchihashi, Fain, Campbell |
| 10Foster13.pdf | Molecules, Clusters, and Storage | Pakarinen | T1620 | NC-AFM imaging of Au clusters on the KBr surface | Finland | Pakarinen, Barth, Foster, Nieminen, Henry |
| 02Reichling4.pdf | Molecules, Clusters, and Storage | Gritschneder | T1640 | The atomic Structure of the CeO2(111) Surface | Germany | Gritschneder, Namai, Iwasawa, Reichling |
| 12Cho1.pdf | Molecules, Clusters, and Storage | Cho | T1700 | Ultra High Density Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy | Japan | Cho, Hiranaga |
| T1930 - 2130 |
Poster Session (Tuesday Posters listed below) | |||||
| Wednesday, September 15, 2004 |
Physics Astronomy Building, University of Washington
Campus
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| 06Dietzel3.pdf | Dissipation | Dietzel |
W0900 (revised time)
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Force Gradient Spectroscopy on C-Nanotube Tips using FM-AFM | France | Dietzel, Marsaudon, Aime, Nguyen |
| 04Sader5.pdf | Force Spectroscopy | Sader | W0920 | Dynamic Force Spectroscopy in Vacuum and Fluids: Theoretical Considerations (Invited) | Australia | Sader |
| 09Sugawara2.pdf | Force Spectroscopy | Sugawara | W1000 | High Sensitive Dynamic Force Microscopy in Liquids | Japan | Sugawara, Fujii, Naitoh, kageshima |
| W1020 | Break | |||||
| 11Jarvis.pdf | ncAFM in Liquids | Jarvis | W1100 | The Measurement of Water Structure with Application to Biological Systems (Invited) | Ireland | Uchihashi, Higgins, Sader, Jarvis |
| 11Higgins9.pdf | ncAFM in Liquids | Higgins | W1140 | FM-AFM in a liquid environment provides new insight into single molecule ligand-receptor interactions | Ireland | Higgins, Reiner, Uchihashi, Yasuda, Sader, McKendry, Jarvis |
| W1200 |
Lunch Break |
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| 10Sugimoto10.pdf | Semiconductors | Sugimoto | W1400 | Surrounding Atom Effect on NC-AFM Images of the Sn/Si(111) Surface Adatoms | Japan | Sugimoto, Abe, Custance, Yi, Morita |
| 10Naitoh14.pdf | Semiconductors | Naitoh | W1420 | Structure Change on Si(001) Surface at 5K Perturbed by AFM Tip | Japan | Naitoh, Ozaki, Li, Kageshima, Sugawara |
| 02Eguchi2.pdf | Semiconductors | Eguchi | W1440 | Direct Observation of Stressor Dimer Stabilizing a Strained Surface | Japan | Eguchi, Fujikawa, Akiyama, An, Ono, Hashimoto, Morikawa, Terakura, Sakurai, Lagally, Hasegawa |
| W1500 | Break | |||||
| 05Arai2.pdf | Various | Arai | W1540 | Scanning interaction spectroscopy with changing bias voltage in noncontact AFM | JAPAN | Arai, Tomitori |
| 02Kaiser1.pdf | Various | Kaiser | W1600 | Charged and non-charged surface defects on NiO (001) investigated by dynamic mode SFM | Germany | Kaiser, Plock, Schwarz, Wiesendanger |
| 01Fukuma3.pdf | Various | Fukuma | W1620 | Development of Low Noise Cantilever Deflection Measurement System for Molecular-Scale Investigations in Various Environments | Japan | Fukuma, Ichii, Kobayashi, Yamada, Matsushige |
| Various | Reichling | W1640 | Summing Up | Germany | ||
| W1830 | ncAFM 2004 Banquet, Faculty Club, University of Washington Campus | |||||
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Monday Poster Session |
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| 15Chen1.pdf | Monday Poster Session | Chen | Monday | A Universal Relation in NC-AFM, STM, and Atom Manipulation | Germany | Chen |
| 10Chiang.pdf | Monday Poster Session | Chiang | Monday | Mapping electric force gradients of IrO2 nanorod thin film using electric force microscopy | USA | Chiang, Lei |
| 10Dana7.pdf | Monday Poster Session | Dana | Monday | Electrostatic force spectroscopy of near surface electronic states | Turkey | Dana, santori, yamamoto |
| 12Georgescu8.pdf | Monday Poster Session | Georgescu | Monday | Magnetic Properties of Thin Films of FePt Nanoparticles Studied with AFM/MFM | Netherlands | Georgescu, Klokkenburg, Van'tZand, Erne, Liljeroth, ZeijlmansvanEmmichoven |
| 12Glatzel9.pdf | Monday Poster Session | Uder | Monday | Low Temperature Kelvin Probe Force Microscopy of Multi-Quantum Well Solar Cells | Germany | Glatzel, Schwarzmann, Grunbaum, Mazzer, Barnham, Lux-Steiner, Rosenwaks |
| 11Hirata18.pdf | Monday Poster Session | Hirata | Monday | Mechanical Unfolding of Influenza Hemagglutinin Using Dynamic Force AFM | Japan | Hirata, Kageshima, Sakai, Niwa, Mizutani, Inoue |
| 10Sugimoto6.pdf | Monday Poster Session | Hirayama | Monday | Highly Resolved Non-contact Atomic Force Microscopy Images of the Sn/Si(111)-(2root3x2root3) Surface | Japan | Hirayama, Sugimoto, Abe, Custance, Morita |
| 10Honda12.pdf | Monday Poster Session | Honda | Monday | Visualization using the Scanning Nonlinear Dielectric Microscopy of electrons and holes localized in the thin gate film of Metal-Oxide-Nitride-Oxide-Semiconductor type flash memory | Japan | Honda, Hashimoto, Cho |
| 11Ichii7.pdf | Monday Poster Session | Ichii | Monday | Molecular-scale Investigations of Semi-insulating Polymer Single Crystals by NC-AFM | Japan | Ichii, Fukuma, Kobayashi, Yamada, Matsushige |
| 11Ichii6.pdf | Monday Poster Session | Ichii | Monday | NC-AFM Investigations of Self-assembled Monolayers of Alkanethiol and Perfluoroalkanethiol | Japan | Ichii, Urabe, Fukuma, Kobayashi, Yamada, Matsushige |
| 10Kolodziej1.pdf | Monday Poster Session | Kolodziej | Monday | Atomically Resolved Imaging of c(8x2)/4x6 GaAs(001) Surface with Noncontact Atomic-Force Microscopy | Poland | Kolodziej, Such, Krok, Szymonski |
| 10Sugimoto8.pdf | Monday Poster Session | Konoshita | Monday | Observation of the c(4x8) surface periodicity on Iron Silicide thin films Using NC-AFM | Japan | Konoshita, Sugimoto, Abe, Morita |
| 12Krok10.pdf | Monday Poster Session | Krok | Monday | Kelvin Probe Force Microscopy of KBr Thin Films Epitaxially Grown on InSb(001) Surface | Poland | Krok, Kolodziej, Such, Piatkowski, Szymonski |
| 10Lauritsen11.pdf | Monday Poster Session | Lauritsen | Monday | Non-contact AFM study on the reaction of H2O with alumina model catalysts | Denmark | Lauritsen, Olesen, Clausen, Besenbacher |
| 12Liebmann4.pdf | Monday Poster Session | Liebmann | Monday | Quantitative Contrast Evaluation in Magnetic Force Microscopy | USA | Liebmann, Schwarz, Wiesendanger |
| 12Ohara5.pdf | Monday Poster Session | Ohara | Monday | Non-contact Scanning Nonlinear Dielectric Microscopy | Japan | Ohara, Cho |
| 10Onishi3.pdf | Monday Poster Session | Onishi | Monday | Constant Frequency-shift Topography of Atom Vacancies Obtained in One-atmospheric N2 | Japan | Sasahara, Uetsuka, Onishi |
| 10Onishi4.pdf | Monday Poster Session | Onishi | Monday | Topography of Anatase TiO2 Films Synthesized on LaAlO3(100) | Japan | Sasahara, Droubay, Chambers, Onishi |
| 10Pai5.pdf | Monday Poster Session | Pai | Monday | Quantitative Analysis of Shape Transition of Ge Islands on Si(100) with nc-AFM | Taiwan R.O.C. | Pai, Chiu, Lu, Lin |
| 15Perez3.pdf | Monday Poster Session | Perez | Monday | Large-scale simulations using the LOTF embedding method for the imaging and mechanical manipulation of single atoms on the Si(111)7x7 surface. | Spain | Csanyi, Jelinek, Perez, Oyabu, Custance, Abe, Morita |
| 10Fain17.pdf | Monday Poster Session | Polwarth | Monday | Particle shapes in ncAFM studies of model catalysts | USA | Polwarth, Tait, Fain |
| 12Sugihara7.pdf | Monday Poster Session | Sugihara | Monday | Three-dimensional measurement of ferroelectric polarization using 3D-type scanning nonlinear dielectric microscopy with an electric field correction | Japan | Sugihara, Odagawa, Cho |
| 10Abe9.pdf | Monday Poster Session | Sugimoto | Monday | Atom Discrimination on Various Reconstructed Surfaces of Sn/Ge(111) Using NC-AFM | Japan | Abe, Sugimoto, Custance, Yi, Morita |
| 10Tanaka16.pdf | Monday Poster Session | Tanaka | Monday | Atomically Resolved NC-AFM Study on Oxidized Surfaces of Single Crystalline SrTiO3 | Japan | Tanaka, Suzuki, Inada, Kamikado, Mashiko |
| 11Pang2.pdf | Monday Poster Session | Thornton | Monday | NC-AFM and STM Study of Methylphosphonic Acid on TiO2(110) | UK | Ferrero, Pang, Ngo, Thornton |
| 11Yoda8.pdf | Monday Poster Session | Yoda | Monday | Investigations of Cu/Co-Phthalocyanines by Non-contact Atomic Force Microscopy | Japan | Yoda, Ichii, Fukuma, Kobayashi, Yamada, Matsushige |
| 10Yu.pdf | Monday Poster Session | Yu | Monday | Particle shapes in ncAFM vs. dSTM experiments for a model catalyst: Pd / MoS2(0001) | USA | Yu, Tait, Fain, Jarvis, Uchihashi |
| 12Zerweck2.pdf | Monday Poster Session | Zerweck | Monday | Resolution and Accuracy of Quantitative Kelvin Probe Force Microscopy | Germany | Zerweck, Loppacher, Otto, Grafstrom, Eng |
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Tuesday Poster Session |
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| 14Akiyama1.pdf | Tuesday Poster Session | Akiyama | Tuesday | Development of Metal AFM Probe for High Spatial Resolution | Japan | Akiyama, Eguchi, An, Hasegawa, Sakurai |
| 01An1.pdf | Tuesday Poster Session | An | Tuesday | Noise analysis and its reduction in the frequency demodulation for atomic force microscopy | Japan | An, Eguchi, Ono, Akiyama, Hasegawa |
| 14Arai2.pdf | Tuesday Poster Session | Arai | Tuesday | TEM observation of a Si nano-pillar grown on a Si tip by UHV AFM | JAPAN | Arai, Tomitori |
| 01Atabak13.pdf | Tuesday Poster Session | Atabak | Tuesday | Simultaneous lateral force and STM imaging of Si(111)-7x7 surface using sub-Angstrom oscillation amplitude AFM | Turkey | Atabak, Durkaya, Ozer, Oral |
| 03Baratoff1.pdf | Tuesday Poster Session | Baratoff | Tuesday | Improved virtual ncAFM with PLL-controlled frequency detection and excitation | Switzerland | Nony, Schar, Baratoff, Wetzel, Pfeiffer, Bennewitz, Meyer |
| 08Choi1.pdf | Tuesday Poster Session | Choi | Tuesday | Effects of Driving Amplitude during Intermittent Contact Force Microscopy upon Examination of Bio-Molecules | Korea | Choi, Chien, Kim, Kim |
| 06Couturier1.pdf | Tuesday Poster Session | Dietzel | Tuesday | Damping signal in NC-AFM: How to Remove the Contribution of the Instrumentation | FRANCE | Couturier, Boisgard, Dietzel, Aimé |
| 04Foster2.pdf | Tuesday Poster Session | Foster | Tuesday | Beyond ideal tips and ideal surfaces | Finland | Oja, Foster, Nieminen |
| 03Fujihira2.pdf | Tuesday Poster Session | Fujihira | Tuesday | Molecular Dynamic Simulation of nc-AFM of Self-Assembled Monolayers of Bicyclo[2.2.2]octane Derivatives on Au(111) | Japan | Bat-Uul, Fujii, Shiokawa, Ohzono, Fujihira |
| 11Fujihira14.pdf | Tuesday Poster Session | Fujii | Tuesday | Differentiation of H- and Cl- Terminated Bicyclo[2.2.2]octane Moieties in a Mixed Self-Assembled Monolayer on Au(111) with Noncontact Atomic Force Microscopy | Japan | Fujii, Akiba, Fujihira |
| 01Fukuma4.pdf | Tuesday Poster Session | Fukuma | Tuesday | Dynamic Force Microscopy at Higher Cantilever Resonance Frequencies Using Heterodyne Optical Beam Deflection Method | Japan | Fukuma, Kimura, Kobayashi, Yamada, Matsushige |
| 07Gannepalli1.pdf | Tuesday Poster Session | Gannepalli | Tuesday | Thermal Non-contact Atomic Force Microscopy | USA | Gannepalli, Sebastian, Cleveland, Salapaka |
| 04Hobbs3.pdf | Tuesday Poster Session | Hobbs | Tuesday | AFM imaging and C60 diffusion on the Si(001) surface | England | Hobbs, Kantorovich |
| 16Hoehberger1.pdf | Tuesday Poster Session | Hoehberger | Tuesday | Optical Cooling of Micromechanical Systems | Germany | Hoehberger, Karrai |
| 01Hug10.pdf | Tuesday Poster Session | Hoogenboom | Tuesday | Scanning Force Microscopy with Ultrasmall Cantilevers | Switzerland | Hug, Hoogenboom, Yang, Frederix, Pellmont, Martin, Despont, Engel |
| 05Kitamura3.pdf | Tuesday Poster Session | Kitamura | Tuesday | Method of Detecting Intermittent-Contact in UHV NC-AFM | Japan | Kitamura |
| 01Koeble8.pdf | Tuesday Poster Session | Koeble | Tuesday | Kelvin Probe Force Microscopy in Ultrahigh Vacuum: Operation at variable temperature and electrical characterization of nanodevices. | Germany | Koeble, Uder, Sadewasser, Glatzel |
| 01Kunstmann7.pdf | Tuesday Poster Session | Kunstmann | Tuesday | Combined Normal and Torsional NC-AFM Measurements: First Results | Germany | Schlarb, Kunstmann, Mšller |
| 09Hoffmann1.pdf | Tuesday Poster Session | Matei | Tuesday | Construction and first results of a small-amplitude AFM for liquid environments | USA | Karakose, Patil, Matei, Dong, Hoffmann, Oral |
| 06Mueller5.pdf | Tuesday Poster Session | Mueller | Tuesday | The Role of Electronic Surface States for the Energy Dissipation on Surfaces | Germany | Kunstmann, Schlarb, Mueller |
| 01Nakae5.pdf | Tuesday Poster Session | Nakae | Tuesday | Development of a Miniaturized Noncontact Atomic Force Microscope Installed into a Tubular Holder for an Ultrahigh-resolution In-lens Field-emission Scanning Electron Microscope | Japan | Nakae, Uno, Arai, Tomitori |
| 01Park.pdf | Tuesday Poster Session | Faddis | Tuesday | Advanced Nanoscale Metrology with nc-AFM | Korea | Faddis, Kwon, Kim, Lee, Park |
| 02Such7.pdf | Tuesday Poster Session | Such | Tuesday | Atomic Structure of Indium-rich InP(001) Surface Imaged by NC-AFM | Poland | Such, Kolodziej, Krok, Piatkowski, Szymonski |
| 01Suzuki2.pdf | Tuesday Poster Session | Suzuki | Tuesday | Does the X-ray have an influence on the Reflection of the NC-AFM Cantilever? | Japan | Suzuki, Koike, Fujikawa, Chun, Nomura, Asakura |
| 07Hoffmann2.pdf | Tuesday Poster Session | Tanulku | Tuesday | Recent results with a small-amplitude AFM in UHV | USA | Patil, Matei, Dong, Tanulku, Hoffmann |
| 06Trevethan6.pdf | Tuesday Poster Session | Trevethan | Tuesday | Dynamical Simulations of Non-Conservative Tip Surface Interactions | UK | Trevethan, Kantorovich |
| 05Uehara1.pdf | Tuesday Poster Session | Uehara | Tuesday | Tip-induced surface relaxation and short-range interaction studied by Non-contact Atomic Force Microscopy imaging of GaAs(110) Surface | Japan | Uehara, Hosoi, Sueoka |
Updated 23 August 2004.
Abstract filenames use conference topic category number followed by submitters name followed by a sequence number.